ASTM 2004- Volume 03.06 Molecular Spectroscopy; Surface Analysis

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ASTM 2004- Volume 03.06 Molecular Spectroscopy; Surface Analysis

% j6 @1 n* \6 |E0131-02 Terminology Relating to Molecular Spectroscopy
E0168-99R04 Practices for General Techniques of Infrared Quantitative Analysis
E0169-04 Practices for General Techniques of Ultraviolet-Visible Quantitative Analysis
E0204-98R02 Practices for Identification of Material by Infrared Absorption Spectroscopy, Using the ASTM Coded Band and Chemical Classification Index
E0250-98R02 Practice for Use of CODEN
E0260-96R01 Practice for Packed Column Gas Chromatography
0 U- o+ L  S( U$ LE0275-01 Practice for Describing and Measuring Performance of Ultraviolet, Visible, and Near-Infrared Spectrophotometers
E0334-01 Practice for General Techniques of Infrared Microanalysis
& R7 k/ v! h  @3 Q5 C, {E0355-96R01 Practice for Gas Chromatography Terms and Relationships
E0386-90R04 Practice for Data Presentation Relating to High-Resolution Nuclear Magnetic Resonance (NMR) Spectroscopy
; }+ E6 O& r& _/ UE0387-04 Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method
E0388-04 Test Method for Wavelength Accuracy of Spectral Bandwidth of Fluorescence Spectrometers
E0516-95AR00 Practice for Testing Thermal Conductivity Detectors Used in Gas Chromatography
# z: G. x* f. LE0573-01 Practices for Internal Reflection Spectroscopy
E0578-01 Test Method for Linearity of Fluorescence Measuring Systems
E0579-04 Test Method for Limit of Detection of Fluorescence of Quinine Sulfate in Solution
E0594-96R01 Practice for Testing Flame Ionization Detectors Used in Gas or Supercritical Fluid Chromatography
8 @! s" w3 _4 d+ [3 Q. TE0682-92R00 Practice for Liquid Chromatography Terms and Relationships
; [! W9 j* }" ?E0685-93R00 Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography
E0697-96R01 Practice for Use of Electron-Capture Detectors in Gas Chromatography
E0840-95R00 Practice for Using Flame Photometric Detectors in Gas Chromatography
8 u; g+ i, z, n/ G$ `6 j' qE0924 Guide for Quality Assurance of Laboratories Using Molecular Spectroscopy
4 ^/ [! D$ h: C% e( v, t+ b3 zE0925-02 Practice for Monitoring the Calibration of Ultraviolet-Visible Spectrophotometers whose Spectral Slit Width does not Exceed 2 nm
E0932-89R02 Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
' n# U& `' _$ h$ {. RE0958-93R05 Practice for Measuring Practical Spectral Bandwidth of Ultraviolet-Visible Spectrophotometers
E1140-95R05 Practice for Testing Nitrogen/Phosphorus Thermionic Ionization Detectors for Use In Gas Chromatography
E1151-93R00 Practice for Ion Chromatography Terms and Relationships
E1252-98R02 Practice for General Techniques for Obtaining Infrared Spectra for Qualitative Analysis
E1303-95R05 Practice for Refractive Index Detectors Used in Liquid Chromatography
8 r, E- I6 V! v% t* oE1421-99R04 Practice for Describing and Measuring Performance of Fourier Transform Mid-Infrared (FT-MIR) Spectrometers: Level Zero and Level One Tests
E1449-92R00 Guide for Supercritical Fluid Chromatography Terms and Relationships
& z5 b- B0 W! \2 A3 h6 TE1510-95R05 Practice for Installing Fused Silica Open Tubular Capillary Columns in Gas Chromatographs
E1511-93R05 Practice for Testing Conductivity Detectors Used in Liquid and Ion Chromatography
, ?2 G. v9 V" |# PE1578-93R99 Guide for Laboratory Information Management Systems (LIMS)
E1614-94R04 Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy andBroadband Systems
$ y3 X9 x* @4 B$ j* z, F9 U3 ]1 RE1642-00 Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis
E1653-94R04 Guide for Specifying Dynamic Characteristics of Optical Radiation Transmitting Fiber Waveguides
" k: L. Z4 F/ H% l) @+ e6 K4 N9 ^: `; AE1654-94R04 Guide for Measuring Ionizing Radiation-Induced Spectral Changes in Optical Fibers and Cables for Use in Remote Raman FiberOptic Spectroscopy
+ U2 Y; M! W% @E1655-05 Practices for Infrared Multivariate Quantitative Analysis
+ \, Z6 e$ ^1 L+ t) j* pE1657-98R01 Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
  y2 Y( J0 V. ~* z+ i2 jE1683-02 Practice for Testing the Performance of Scanning Raman Spectrometers
3 {+ L7 \) n, F. }E1698-95R00 Practice for Testing Electrolytic Conductivity Detectors (ELCD) Used in Gas Chromatography
E1747-95R00 Guide for Purity of Carbon Dioxide Used in Supercritical Fluid Applications
& z& |7 B: d9 E/ R1 ~: j) |5 v" [E1790-04 Practice for Near Infrared Qualitative Analysis
E1791-96R00 Practice for Transfer Standards for Reflectance Factor for Near-Infrared Instruments Using Hemispherical Geometry
5 ^) z* C9 ?+ P2 q7 b( DE1840-96R02 Guide for Raman Shift Standards for Spectrometer Calibration
E1865-97R02 Guide for Open-Path Fourier Transform Infrared (OP/FT-IR) Monitoring of Gases and Vapors in Air
E1866-97R02 Guide for Establishing Spectrophotometer Performance Tests
E1944-98R02 Practice for Describing and Measuring Performance of Laboratory Fourier Transform Near-Infrared (FT-NIR) Spectrometers: Level Zero and Level One Tests
E1947-98R04 Specification for Analytical Data Interchange Protocol for Chromatographic Data
E1948-98R04 Guide for Analytical Data Interchange Protocol for Chromatographic Data
; G- I8 i) |# k. h: ~. {E1982-98R02 Practice for Open-Path Fourier Transform Infrared (OP/FT-IR) Monitoring of Gases and Vapors in Air
- v4 F- X/ X. ~' u/ U7 b0 JE1989-98R04 Specification for Laboratory Equipment Control Interface (LECIS)
E2056-04 Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
E2066-00 Guide for Validation of Laboratory Information Management Systems
$ ^3 l5 w. r4 Y. K! o8 U* @% E, ME2077-00 Specification for Analytical Data Interchange Protocol for Mass Spectrometric Data
! \" p0 l& P0 w. D) Z9 GE2078-00 Guide for Analytical Data Interchange Protocol for Mass Spectrometric Data
E2105-00 Practice for General Techniques of Thermogravimetric Analysis (TGA) Coupled With Infrared Analysis (TGA/IR)
E2106-00 Practice for General Techniques of Liquid Chromatography-Infrared (LC/IR) and Size Exclusion Chromatography-Infrared (SEC/IR) Analyses
! q' g% H  b; c& ?. S* Y) ^: bE2143-01 Practice for Using Field-Portable Fiber Optics Synchronous Fluorescence Spectrometer for Quantification of Field Samples for Aromatic and Polycyclic Aromatic Hydrocarbons
E2310-04 Guide for Use of Spectral Searching by Curve Matching Algorithms with Data Recorded Using Mid-infrared Spectroscopy
E2412-04 Practice for Condition Monitoring of Used Lubricants by Trend Analysis Using Fourier Transform Infrared (FT-IR) Spectrometry
E0673-03 Terminology Relating to Surface Analysis
E0684-04 Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces
E0827-02 Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
! D' F3 z* y  HE0902-05 Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
E0983-05 Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
+ E5 [/ n! D' f: s1 mE0984-95R01 Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
$ s2 t7 P1 r# d! x) j6 T: }) lE0995-04 Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
/ g: ~% d% @1 G3 d" _( l( EE0996-04 Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
5 A; w6 }9 u% k; dE1016-96R02 Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
E1078-02 Guide for Specimen Preparation and Mounting in Surface Analysis
- \& F6 g8 W, eE1127-03 Guide for Depth Profiling in Auger Electron Spectroscopy
9 T; p# g  X* Z! e0 v/ lE1162-87R01 Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
* l3 r# |1 R* y; H% N2 i! ]* }! FE1217-00 Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
4 a% [. y/ z3 |' O% B. ^; nE1438-91R01 Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
E1504-92R01 Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
E1505-92R01 Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards
E1523-03 Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
E1577-04 Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
- P" w, O, m" Z- O4 o) m# Z7 J. Q. gE1634-02 Guide for Performing Sputter Crater Depth Measurements
# E: W' j4 v6 CE1635-95R00 Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
E1636-04 Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function
8 X5 {/ c- s. [$ `. C) N0 v8 E4 eE1813-96R02 Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
' M8 b" d/ h' y' @E1829-02 Guide for Handling Specimens Prior to Surface Analysis
9 r, l3 H0 Q7 H8 W  w) T. G9 aE1880-97R02 Practice for Tissue Cryosection Analysis with SIMS
E1881-97R02 Guide for Cell Culture Analysis with SIMS
: I5 A+ C$ D, z& O4 `E2108-00 Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
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