ASTM 2004- Volume 03.06 Molecular Spectroscopy; Surface Analysis

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ASTM 2004- Volume 03.06 Molecular Spectroscopy; Surface Analysis
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E0131-02 Terminology Relating to Molecular Spectroscopy
" t. @! S' n  L* w5 vE0168-99R04 Practices for General Techniques of Infrared Quantitative Analysis
E0169-04 Practices for General Techniques of Ultraviolet-Visible Quantitative Analysis
1 ^* [% H/ Y# w. U+ P/ BE0204-98R02 Practices for Identification of Material by Infrared Absorption Spectroscopy, Using the ASTM Coded Band and Chemical Classification Index
8 l# f( W/ O) l% F4 A; f5 Y  KE0250-98R02 Practice for Use of CODEN
E0260-96R01 Practice for Packed Column Gas Chromatography
4 a5 q0 T# R! P* v1 D% _+ H, IE0275-01 Practice for Describing and Measuring Performance of Ultraviolet, Visible, and Near-Infrared Spectrophotometers
+ W3 \* V" R* a- b8 nE0334-01 Practice for General Techniques of Infrared Microanalysis
8 y1 P! h2 T4 N; U$ z3 H! SE0355-96R01 Practice for Gas Chromatography Terms and Relationships
E0386-90R04 Practice for Data Presentation Relating to High-Resolution Nuclear Magnetic Resonance (NMR) Spectroscopy
E0387-04 Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method
1 L/ p: W1 p& T& X/ f" B. iE0388-04 Test Method for Wavelength Accuracy of Spectral Bandwidth of Fluorescence Spectrometers
E0516-95AR00 Practice for Testing Thermal Conductivity Detectors Used in Gas Chromatography
E0573-01 Practices for Internal Reflection Spectroscopy
: `6 o+ S" @& @1 zE0578-01 Test Method for Linearity of Fluorescence Measuring Systems
+ k+ t) S+ A. O" jE0579-04 Test Method for Limit of Detection of Fluorescence of Quinine Sulfate in Solution
E0594-96R01 Practice for Testing Flame Ionization Detectors Used in Gas or Supercritical Fluid Chromatography
E0682-92R00 Practice for Liquid Chromatography Terms and Relationships
+ M/ U4 x% T& q7 t, }E0685-93R00 Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography
7 f! w% k( ?% S# X( d0 \* VE0697-96R01 Practice for Use of Electron-Capture Detectors in Gas Chromatography
E0840-95R00 Practice for Using Flame Photometric Detectors in Gas Chromatography
E0924 Guide for Quality Assurance of Laboratories Using Molecular Spectroscopy
' C3 e$ w5 E% P% qE0925-02 Practice for Monitoring the Calibration of Ultraviolet-Visible Spectrophotometers whose Spectral Slit Width does not Exceed 2 nm
E0932-89R02 Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
7 D! w# R+ X! @. v+ M7 [3 EE0958-93R05 Practice for Measuring Practical Spectral Bandwidth of Ultraviolet-Visible Spectrophotometers
# Q* F9 b9 p7 P' a/ AE1140-95R05 Practice for Testing Nitrogen/Phosphorus Thermionic Ionization Detectors for Use In Gas Chromatography
E1151-93R00 Practice for Ion Chromatography Terms and Relationships
% h0 g  r8 i2 t+ d- Y/ zE1252-98R02 Practice for General Techniques for Obtaining Infrared Spectra for Qualitative Analysis
' t) ~* B( T$ H% L! P0 P- IE1303-95R05 Practice for Refractive Index Detectors Used in Liquid Chromatography
E1421-99R04 Practice for Describing and Measuring Performance of Fourier Transform Mid-Infrared (FT-MIR) Spectrometers: Level Zero and Level One Tests
) l8 w. b/ I4 |; ~3 P5 W8 {E1449-92R00 Guide for Supercritical Fluid Chromatography Terms and Relationships
' a' A1 z+ q1 W, c$ iE1510-95R05 Practice for Installing Fused Silica Open Tubular Capillary Columns in Gas Chromatographs
E1511-93R05 Practice for Testing Conductivity Detectors Used in Liquid and Ion Chromatography
( {  T) Q5 ?% [E1578-93R99 Guide for Laboratory Information Management Systems (LIMS)
E1614-94R04 Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy andBroadband Systems
E1642-00 Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis
E1653-94R04 Guide for Specifying Dynamic Characteristics of Optical Radiation Transmitting Fiber Waveguides
E1654-94R04 Guide for Measuring Ionizing Radiation-Induced Spectral Changes in Optical Fibers and Cables for Use in Remote Raman FiberOptic Spectroscopy
E1655-05 Practices for Infrared Multivariate Quantitative Analysis
( l) V$ j: l6 o. |1 i- x8 EE1657-98R01 Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
E1683-02 Practice for Testing the Performance of Scanning Raman Spectrometers
E1698-95R00 Practice for Testing Electrolytic Conductivity Detectors (ELCD) Used in Gas Chromatography
E1747-95R00 Guide for Purity of Carbon Dioxide Used in Supercritical Fluid Applications
4 l! T/ Y$ ?  p  G# x" x& ZE1790-04 Practice for Near Infrared Qualitative Analysis
E1791-96R00 Practice for Transfer Standards for Reflectance Factor for Near-Infrared Instruments Using Hemispherical Geometry
E1840-96R02 Guide for Raman Shift Standards for Spectrometer Calibration
E1865-97R02 Guide for Open-Path Fourier Transform Infrared (OP/FT-IR) Monitoring of Gases and Vapors in Air
E1866-97R02 Guide for Establishing Spectrophotometer Performance Tests
E1944-98R02 Practice for Describing and Measuring Performance of Laboratory Fourier Transform Near-Infrared (FT-NIR) Spectrometers: Level Zero and Level One Tests
E1947-98R04 Specification for Analytical Data Interchange Protocol for Chromatographic Data
E1948-98R04 Guide for Analytical Data Interchange Protocol for Chromatographic Data
7 m( e5 B  d& z4 o' d2 }2 @5 yE1982-98R02 Practice for Open-Path Fourier Transform Infrared (OP/FT-IR) Monitoring of Gases and Vapors in Air
E1989-98R04 Specification for Laboratory Equipment Control Interface (LECIS)
E2056-04 Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
E2066-00 Guide for Validation of Laboratory Information Management Systems
6 B4 ]. _3 c+ f; J: D0 F# Z$ Y0 FE2077-00 Specification for Analytical Data Interchange Protocol for Mass Spectrometric Data
' h+ n9 d# u9 J- M5 G1 k" jE2078-00 Guide for Analytical Data Interchange Protocol for Mass Spectrometric Data
8 t& g* a: u1 \* \; j9 nE2105-00 Practice for General Techniques of Thermogravimetric Analysis (TGA) Coupled With Infrared Analysis (TGA/IR)
$ i. i( E. h6 T% k9 PE2106-00 Practice for General Techniques of Liquid Chromatography-Infrared (LC/IR) and Size Exclusion Chromatography-Infrared (SEC/IR) Analyses
2 Q2 x* H1 R- C& b! oE2143-01 Practice for Using Field-Portable Fiber Optics Synchronous Fluorescence Spectrometer for Quantification of Field Samples for Aromatic and Polycyclic Aromatic Hydrocarbons
E2310-04 Guide for Use of Spectral Searching by Curve Matching Algorithms with Data Recorded Using Mid-infrared Spectroscopy
E2412-04 Practice for Condition Monitoring of Used Lubricants by Trend Analysis Using Fourier Transform Infrared (FT-IR) Spectrometry
E0673-03 Terminology Relating to Surface Analysis
E0684-04 Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces
E0827-02 Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
E0902-05 Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
# p+ @$ ~& v5 @) y( C3 V5 w$ {E0983-05 Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
E0984-95R01 Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
E0995-04 Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
) S0 ?0 L8 M, y. e5 QE0996-04 Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
E1016-96R02 Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
E1078-02 Guide for Specimen Preparation and Mounting in Surface Analysis
E1127-03 Guide for Depth Profiling in Auger Electron Spectroscopy
& J3 f% R, Q5 Y, gE1162-87R01 Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
E1217-00 Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
E1438-91R01 Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
( \1 Y% [4 h6 @* S& ?/ GE1504-92R01 Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
E1505-92R01 Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards
E1523-03 Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
1 S! U  x: b% PE1577-04 Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
( f+ d/ u' ?, V) vE1634-02 Guide for Performing Sputter Crater Depth Measurements
* ^% ^, @3 R, ~0 R4 U" CE1635-95R00 Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
2 I% {9 |2 f4 r5 Y$ {) o. cE1636-04 Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function
8 `  h1 E* ?* f- E( yE1813-96R02 Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
3 D$ Q* ~1 N3 ~* E3 y) M3 ?5 v, hE1829-02 Guide for Handling Specimens Prior to Surface Analysis
5 F; R1 c9 \2 Z0 JE1880-97R02 Practice for Tissue Cryosection Analysis with SIMS
% @3 T; ], e! a3 T0 k6 Y# DE1881-97R02 Guide for Cell Culture Analysis with SIMS
E2108-00 Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
* B1 y6 Z  [5 O1 b- ^1 EE2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy