ASTM 2004- Volume 03.06 Molecular Spectroscopy; Surface Analysis

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ASTM 2004- Volume 03.06 Molecular Spectroscopy; Surface Analysis

! k& |" I, K6 h0 A. oE0131-02 Terminology Relating to Molecular Spectroscopy
E0168-99R04 Practices for General Techniques of Infrared Quantitative Analysis
6 p4 d& ~# d& L5 U7 `; YE0169-04 Practices for General Techniques of Ultraviolet-Visible Quantitative Analysis
) a$ r6 g8 ~" W/ d2 ~E0204-98R02 Practices for Identification of Material by Infrared Absorption Spectroscopy, Using the ASTM Coded Band and Chemical Classification Index
/ E. C! G) W7 h  i5 r1 y! L& TE0250-98R02 Practice for Use of CODEN
" c9 {( R* I- \8 aE0260-96R01 Practice for Packed Column Gas Chromatography
E0275-01 Practice for Describing and Measuring Performance of Ultraviolet, Visible, and Near-Infrared Spectrophotometers
4 X3 D7 Z$ d/ ]' J2 e/ \9 FE0334-01 Practice for General Techniques of Infrared Microanalysis
( c& ]5 q5 T2 y3 NE0355-96R01 Practice for Gas Chromatography Terms and Relationships
E0386-90R04 Practice for Data Presentation Relating to High-Resolution Nuclear Magnetic Resonance (NMR) Spectroscopy
E0387-04 Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method
E0388-04 Test Method for Wavelength Accuracy of Spectral Bandwidth of Fluorescence Spectrometers
* w$ U) p) n5 d. x: y4 Q; G- [4 oE0516-95AR00 Practice for Testing Thermal Conductivity Detectors Used in Gas Chromatography
' r$ f' i' Z6 d0 n6 IE0573-01 Practices for Internal Reflection Spectroscopy
& K1 {. B2 |: pE0578-01 Test Method for Linearity of Fluorescence Measuring Systems
E0579-04 Test Method for Limit of Detection of Fluorescence of Quinine Sulfate in Solution
+ A+ u2 [* N% B. H$ iE0594-96R01 Practice for Testing Flame Ionization Detectors Used in Gas or Supercritical Fluid Chromatography
E0682-92R00 Practice for Liquid Chromatography Terms and Relationships
6 K3 j5 n) a# uE0685-93R00 Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography
# ]4 p( ^8 a) T6 N( Z: B# T+ H) iE0697-96R01 Practice for Use of Electron-Capture Detectors in Gas Chromatography
& F4 s$ m  D/ s) e6 P. |. I8 iE0840-95R00 Practice for Using Flame Photometric Detectors in Gas Chromatography
, V1 h4 o, S6 q& IE0924 Guide for Quality Assurance of Laboratories Using Molecular Spectroscopy
E0925-02 Practice for Monitoring the Calibration of Ultraviolet-Visible Spectrophotometers whose Spectral Slit Width does not Exceed 2 nm
E0932-89R02 Practice for Describing and Measuring Performance of Dispersive Infrared Spectrometers
& _) L8 w3 j% P" ?$ NE0958-93R05 Practice for Measuring Practical Spectral Bandwidth of Ultraviolet-Visible Spectrophotometers
E1140-95R05 Practice for Testing Nitrogen/Phosphorus Thermionic Ionization Detectors for Use In Gas Chromatography
E1151-93R00 Practice for Ion Chromatography Terms and Relationships
E1252-98R02 Practice for General Techniques for Obtaining Infrared Spectra for Qualitative Analysis
! y. L& l4 V; @  tE1303-95R05 Practice for Refractive Index Detectors Used in Liquid Chromatography
+ J: J3 U6 d' ]( m: g) yE1421-99R04 Practice for Describing and Measuring Performance of Fourier Transform Mid-Infrared (FT-MIR) Spectrometers: Level Zero and Level One Tests
E1449-92R00 Guide for Supercritical Fluid Chromatography Terms and Relationships
E1510-95R05 Practice for Installing Fused Silica Open Tubular Capillary Columns in Gas Chromatographs
  ?6 q! b5 T$ }5 Q' hE1511-93R05 Practice for Testing Conductivity Detectors Used in Liquid and Ion Chromatography
' d- b) ?8 Q4 I4 g+ ~+ TE1578-93R99 Guide for Laboratory Information Management Systems (LIMS)
E1614-94R04 Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy andBroadband Systems
* ^, l8 Z+ C! }% F1 h3 iE1642-00 Practice for General Techniques of Gas Chromatography Infrared (GC/IR) Analysis
! ?* W5 e4 p8 u4 S7 g2 E9 H! gE1653-94R04 Guide for Specifying Dynamic Characteristics of Optical Radiation Transmitting Fiber Waveguides
E1654-94R04 Guide for Measuring Ionizing Radiation-Induced Spectral Changes in Optical Fibers and Cables for Use in Remote Raman FiberOptic Spectroscopy
: O: S5 O$ @" vE1655-05 Practices for Infrared Multivariate Quantitative Analysis
E1657-98R01 Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
E1683-02 Practice for Testing the Performance of Scanning Raman Spectrometers
E1698-95R00 Practice for Testing Electrolytic Conductivity Detectors (ELCD) Used in Gas Chromatography
E1747-95R00 Guide for Purity of Carbon Dioxide Used in Supercritical Fluid Applications
E1790-04 Practice for Near Infrared Qualitative Analysis
7 _/ r- r) S4 S$ ], G3 lE1791-96R00 Practice for Transfer Standards for Reflectance Factor for Near-Infrared Instruments Using Hemispherical Geometry
E1840-96R02 Guide for Raman Shift Standards for Spectrometer Calibration
/ j6 \9 R. S( V1 P! oE1865-97R02 Guide for Open-Path Fourier Transform Infrared (OP/FT-IR) Monitoring of Gases and Vapors in Air
+ _# o: Y) t% \( DE1866-97R02 Guide for Establishing Spectrophotometer Performance Tests
E1944-98R02 Practice for Describing and Measuring Performance of Laboratory Fourier Transform Near-Infrared (FT-NIR) Spectrometers: Level Zero and Level One Tests
E1947-98R04 Specification for Analytical Data Interchange Protocol for Chromatographic Data
E1948-98R04 Guide for Analytical Data Interchange Protocol for Chromatographic Data
E1982-98R02 Practice for Open-Path Fourier Transform Infrared (OP/FT-IR) Monitoring of Gases and Vapors in Air
E1989-98R04 Specification for Laboratory Equipment Control Interface (LECIS)
" \5 O- X# _1 `+ G3 C' QE2056-04 Practice for Qualifying Spectrometers and Spectrophotometers for Use in Multivariate Analyses, Calibrated Using Surrogate Mixtures
E2066-00 Guide for Validation of Laboratory Information Management Systems
E2077-00 Specification for Analytical Data Interchange Protocol for Mass Spectrometric Data
0 }  }: u0 N% w* {9 c3 KE2078-00 Guide for Analytical Data Interchange Protocol for Mass Spectrometric Data
E2105-00 Practice for General Techniques of Thermogravimetric Analysis (TGA) Coupled With Infrared Analysis (TGA/IR)
( Y  ?$ M! \+ p0 f0 g- N) F9 B7 w  qE2106-00 Practice for General Techniques of Liquid Chromatography-Infrared (LC/IR) and Size Exclusion Chromatography-Infrared (SEC/IR) Analyses
E2143-01 Practice for Using Field-Portable Fiber Optics Synchronous Fluorescence Spectrometer for Quantification of Field Samples for Aromatic and Polycyclic Aromatic Hydrocarbons
( V) W' E' @9 `5 dE2310-04 Guide for Use of Spectral Searching by Curve Matching Algorithms with Data Recorded Using Mid-infrared Spectroscopy
5 z& L  L( w" c, V8 Y) b* HE2412-04 Practice for Condition Monitoring of Used Lubricants by Trend Analysis Using Fourier Transform Infrared (FT-IR) Spectrometry
E0673-03 Terminology Relating to Surface Analysis
E0684-04 Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces
E0827-02 Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
E0902-05 Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
E0983-05 Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
4 A% _; S  x+ J2 dE0984-95R01 Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
3 _" g6 ^( P0 \E0995-04 Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
E0996-04 Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
E1016-96R02 Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
E1078-02 Guide for Specimen Preparation and Mounting in Surface Analysis
8 N+ I6 s# r1 T; U4 J) M+ @' b3 QE1127-03 Guide for Depth Profiling in Auger Electron Spectroscopy
6 d0 K) e" q& M% V* q2 gE1162-87R01 Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
; w$ E+ L2 s: x$ [# DE1217-00 Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
1 r5 f& ?5 Y6 D) T- F/ B  dE1438-91R01 Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
2 E- a3 v$ N6 D5 g  DE1504-92R01 Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
E1505-92R01 Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards
E1523-03 Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
: b" Q5 @& j% w, n+ W+ f3 y( tE1577-04 Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
E1634-02 Guide for Performing Sputter Crater Depth Measurements
; B( f2 q7 N3 oE1635-95R00 Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
E1636-04 Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function
1 y  V8 x: l9 b4 |6 zE1813-96R02 Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
E1829-02 Guide for Handling Specimens Prior to Surface Analysis
: B, a0 G6 k8 I" k: ~+ i( S4 ~3 O+ WE1880-97R02 Practice for Tissue Cryosection Analysis with SIMS
E1881-97R02 Guide for Cell Culture Analysis with SIMS
7 z% r4 o3 P$ z3 V$ x& G; iE2108-00 Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy